Fig. 7From: Functionalization of Ti-40Nb implant material with strontium by reactive sputteringTOF SIMS data; ToF-SIMS depth profiles of the SrO x Cl y coated Ti-40Nb sample. In a) the depth profile obtained from secondary cations is depicted. In b) the depth profile obtained from secondary anions is depicted. SrO x Cl y was deposited at room temperature, P = 100 W, 0.25 sccm O2, 0.68 sccm Ar, t = 5 hBack to article page