Fig. 6From: Functionalization of Ti-40Nb implant material with strontium by reactive sputteringTEM images and EDX spectra; (a) TEM brightfield image and EDX spectra acquired from the marked areas (substrate, interface, Sr film). (b) X-ray energy range 0 … 7000 eV, (c) X-ray energy range 200 … 800 eVBack to article page